二硒化鋯晶體 ZrSe2 (Zirconium Selenide)
晶體尺寸:~8毫米
電學性能:半導體
晶體結構:六邊形
晶胞參數(shù):a = b = 0.377, c = 0.614 nm, α = β = 90°, γ = 120°
晶體類型:合成
晶體純度:>99.995%
X-ray diffraction on a ZrSe2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (00l) with l = 1, 2, 3, 4
Powder X-ray diffraction (XRD) of a single crystal ZrSe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal ZrSe2 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal ZrSe2. Measurement was performed with a 785 nm Raman system at room temperature.